Scanning Probe Microscopy
Atomic Force Microscope (Asylum Research MFP-3D) capable of measuring surface structural features and electronic and magnetic properties with Angstrom level vertical resolution, and nanometer scale lateral resolution.
Modes of Operation:
- Surface imaging modes: Contact; Constant force, Constant height; Lateral Force; Non-contact; AC (intermittent contact); Phase; Dual AC™
- Magnetic Force Microscopy (MFM)
- Electric Force Microscopy (EFM)
- Surface potential (Scanning Kelvin Probe microscopy)
- Piezo Force Microscopy (PFM)
- Non-imaging modes: Force; Force/Distance spectroscopy; Force Volume Mapping
- Nanolithography and Nanomanipulation
Schedule time on this instrument
To become a user contact Prof. Maitri Warusawithana
