The JEM-2011

JEM-2011 Transmission/Scanning Electron Microscope

This 200 kV transmission electron microscope is fitted with a LaB6 filament and has a lattice and point resolutions of 0.14 nm and 0.23 nm, respectively. Its magnification ranges from 100x to 1500,000x, and it is equipped with a scanning unit, PGT Energy Dispersive Spectroscopy (EDS) detector, a side entry AMT CCD camera.

In addition to high resolution imaging capability, the equipment allows localized compositional and structural analyses of materials.

Typical analyses include:

• Conventional diffraction contrast imaging
• Electron diffraction
• High resolution transmission electron imaging
• Nano scale compositional analysis with 10 nm spatial resolution

Information on how this instrument is being used is available on our scheduling page (accessible only to MagLab and FSU staff) and by contacting Yan Xin.

This TEM bright field diffraction contrast image shows the dislocation networks inside the superconductor Sr₂RuO₄.

Molecular beam epitaxial film of GaAs/AlGaAs multilayers used in the chip of a cell phone.
Click on image for details.