JEOL-2010 Transmission Electron Microscope
JEOL-2010 transmission and scanning transmission electron microscope.
This state-of-the-art 200 kV electron microscope is fitted with a LaB6 filament and has a lattice and theoretical point resolutions of 0.14 nm and 0.23 nm, respectively. Its magnification ranges from 100x to 1500,000x, and it is equipped with a scanning unit, Germanium Energy Dispersive Spectroscopy (EDS) detector, a side entry slow scan CCD camera, and a JEOL bright field detector. In addition to high resolution imaging capability, the equipment allows localized compositional and structural analyses of materials. Typical analyses include:
- Conventional diffraction contrast imaging
- Convergent beam electron diffraction
- High resolution transmission electron imagings
- Nano scale compositional analysis with 2 nm probe size, EDS compositional mapping
- Orientation Imaging Microscopy for microtexture analysis in TEM
- Secondary and back scattered electron imaging for comparison of surface and internal structures
Information on how this instrument is being used is available on our scheduling page and by contacting Yan Xin.
