JEOL JSM-840 Transmission Electron Microscope

JEOL JSM-840 scanning electron microscope.

This scanning electron microscope operates at accelerating voltage from 200 V to 40 kV. Its magnification ranges from 10x to 300,000x, with a resolution of 4 nm. This instrument is used for:

• Conducting morphological characterization of ultra fine microstructures of biological or metallic samples
• Performing standard SEM imaging analyses
• Training students and researchers

For more information, please contact Bob Goddard.