Electroscan Environmental Scanning Electron Microscope

Environmental Scanning Electron Microscope.

The Electroscan Model E-3 ESEM operates with the performance of a conventional scanning electron microscope (SEM), but has the additional advantage of variable specimen environment. The microscope operates up to 30 kV, with magnification from 50x to 200,000x. The electron gun source is LaB₆ and has a resolution of 4 nm. The ESEM is equipped with a high resolution imaging archive system, a Princeton Gamma-Tech energy dispersive x-ray and imaging analysis system, and a backscattered electron detector. The capabilities of this microscope include:

• High resolution secondary electron imaging at pressures as high as 50 torr in variable gaseous environments
• In-situ experiments at temperatures up to 1500°C
• Standard SEM imaging and compositional analysis on various materials, such as hydrated, oily and non-conductive samples in their natural state without modification, coatings or preparation
• Orientation Imaging Microscopy for local texture, grain orientation and grain boundary structure analyses

For more information or assistance, please contact Bob Goddard.